极化光谱发射率测量装置的研制
发布时间：2019-03-25 18:43
【摘要】：发射率是表征材料热物性的参数之一,代表了物体对外辐射能力的强弱,在辐射测温、航空航天、遥感、军事隐身、医学理疗等方面都有着重要的应用。相比全波长发射率,材料的光谱发射率携带的信息更加全面,应用也更加广泛,目前已成功应用于分子识别、隐身材料辐射特性评价以及红外基础研究等领域。例如在辐射测温中,材料准确的发射率数据决定了辐射测温仪的测量精度。但在不同的测量条件下,材料的发射率是一个易变的量,受温度、波长、粗糙度等诸多因素的影响,这严重制约了辐射测温的快速发展。与非极化的发射率相比。材料的极化光谱发射率具有一些特殊性质,通过研究材料极化光谱发射率的变化规律可以探索其在辐射测温以及遥感等领域的应用。近年来,国内外开始加强了对材料极化辐射性质的研究。但不得不承认:极化发射率相关的测量设备依旧很少,相应的极化发射率数据也十分匮乏。因此本文在国家自然科学基金的支持下,建立了一套极化光谱发射率测量实验装置,并对纯铝以及钛合金的辐射性质做了深入的研究。本文主要工作如下:1、基于能量法建立了一套极化光谱发射率测量实验装置,装置一共包括样品加热和控温系统、黑体、光学系统、机械系统、电测系统以及信号采集系统。其中样品加热系统和黑体炉属于装置中的辐射信号源;光学系统主要包括由滤波片、偏振分束立方、辐射探头、光纤和光开关;机械系统主要用于控制样品和黑体的转换以及实现不同角度的辐射测量;电测系统由以下两部分组成:1、探测器;2、由斩波器和锁相放大器组成的放大系统;信号采集系统基于Labview软件控制了电机的旋转,并对锁相放大器的输出信号做了采集和存储。2、对装置几个重要方面,包括样品温度均匀性、黑体炉轴向温度均匀性以及系统的响应系数进行了测试评价。通过将实验测得的硅片极化光谱发射率数据与理论模拟和国外实验数据做对比,验证了装置的可靠性。3、提出了一种模拟粗糙金属表面方向发射率的方法,通过理论计算和实验数据的对比说明了该方法可用于估算粗糙金属氧化过程中0-70°的方向发射率,同时得到结论:随着氧化程度的增加,粗糙纯铝表面0-70°的方向发射率逐渐增大,70°的发射率几乎保持不变。运用模拟计算的方向发射率去校准粗糙纯铝的表面温度,实验结果和热电偶测量结果的对比证明了这种方向发射率模拟方法可用于辐射测温,且在70°计算的发射率更适用于校准氧化过程中的粗糙纯铝样品的表面温度。4、研究了热氧化过程中Ti-6Al-4V合金的法向光谱发射率以及氧化过程中发射率波动变化的具体原因。实验得出,氧化前Ti-6Al-4V合金的光谱发射率在823-973 K之间随温度呈近似线性的增长;当氧化温度低于873 K时,发射率会随氧化时间慢慢增长,当温度高于923 K时,发射率会随时间呈不同程度的波动变化;表面粗糙度是影响发射率波动曲线振幅变化的因素之一,由氧化膜和基底产生的干涉作用则是引起发射率波动变化的主要原因;Ti-6Al-4V合金在空气中进行热氧化时,表面氧化膜遵循抛物线增长规律,且氧化速率在温度大于923 K时会迅速增长。
[Abstract]:The emissivity is one of the parameters characterizing the thermal physical property of the material, which represents the strength of the external radiation ability of the object, and has an important application in the aspects of radiation temperature measurement, aerospace, remote sensing, military stealth, medical physical therapy and the like. Compared with the full-wavelength emissivity, the information carried by the spectral emissivity of the material is more comprehensive, the application is more extensive, and the invention has been successfully applied to the fields of molecular recognition, radiation characteristic evaluation of stealth materials and infrared-based research. For example, in the radiation temperature measurement, the accurate emissivity data of the material determines the measurement accuracy of the radiation thermometer. However, under different measuring conditions, the emissivity of the material is a variable quantity, influenced by many factors such as temperature, wavelength and roughness, which seriously restricts the rapid development of the radiation temperature measurement. In contrast to non-polarized emissivity. The polarization spectral emissivity of the material has some special properties, and its application in the fields of radiation temperature measurement and remote sensing can be explored by studying the variation of the polarization spectral emissivity of the material. In recent years, the research on the properties of the material's polarized radiation has been strengthened at home and abroad. However, it has to be admitted that the measurement equipment related to the polarization emissivity is still very small, and the corresponding polarized emissivity data is also very scarce. Based on the support of the National Natural Science Foundation of China, a set of experimental apparatus for measuring the emissivity of the polarization spectrum is set up, and the radiation properties of pure aluminum and titanium alloy are studied. The main work of this paper is as follows:1. An experimental device for measuring the emissivity of a set of polarization spectrum is established based on the energy method. The device includes a sample heating and temperature control system, a blackbody, an optical system, a mechanical system, an electric system and a signal acquisition system. wherein the sample heating system and the blackbody furnace belong to a radiation signal source in the device; the optical system mainly comprises a filter plate, a polarization beam splitting cube, a radiation probe, an optical fiber and an optical switch, wherein the mechanical system is mainly used for controlling the conversion of the sample and the black body and realizing the radiation measurement at different angles; the electric system consists of the following two parts:1, a detector;2, an amplification system consisting of a chopper and a phase-locked amplifier; the signal acquisition system controls the rotation of the motor based on the Labview software, and acquires and stores the output signal of the phase-locked amplifier; and 2, Including the uniformity of the temperature of the sample, the uniformity of the axial temperature of the blackbody furnace and the response coefficient of the system. the reliability of the device is verified by comparing the measured spectral emissivity data of the silicon wafer with the theoretical simulation and the foreign experimental data, and 3, a method for simulating the direction emissivity of the rough metal surface is provided, Through the comparison of the theoretical calculation and the experimental data, the method can be used to estimate the direction emissivity of 0-70 掳 in the rough metal oxidation process, and it is concluded that with the increase of the oxidation degree, The emissivity of the rough pure aluminum surface in the direction of 0-70 DEG is gradually increased, and the emissivity of 70 DEG is almost unchanged. The surface temperature of the rough pure aluminum, the experimental results and the comparison of the measurement results of the thermocouple are proved by using the directional emissivity of the simulation. The method can be used for the radiation temperature measurement. And the emissivity of the Ti-6Al-4V alloy in the thermal oxidation process and the specific cause of the change of the emissivity in the oxidation process are studied. The results show that the spectral emissivity of the pre-oxidized Ti-6Al-4V alloy increases linearly with the temperature in the range of 823-973K; when the oxidation temperature is lower than 873 K, the emissivity increases with the oxidation time, and when the temperature is higher than 923 K, the emissivity changes with the time; The surface roughness is one of the factors that affect the change of the amplitude of the emissivity fluctuation curve. The interference between the oxide film and the substrate is the main cause of the change of the emissivity. When the Ti-6Al-4V alloy is thermally oxidized in the air, the surface oxide film follows the law of the parabola growth. And the oxidation rate will increase rapidly when the temperature is greater than 923 k.
【学位授予单位】：河南师范大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：O433.1
本文编号：2447216
[Abstract]:The emissivity is one of the parameters characterizing the thermal physical property of the material, which represents the strength of the external radiation ability of the object, and has an important application in the aspects of radiation temperature measurement, aerospace, remote sensing, military stealth, medical physical therapy and the like. Compared with the full-wavelength emissivity, the information carried by the spectral emissivity of the material is more comprehensive, the application is more extensive, and the invention has been successfully applied to the fields of molecular recognition, radiation characteristic evaluation of stealth materials and infrared-based research. For example, in the radiation temperature measurement, the accurate emissivity data of the material determines the measurement accuracy of the radiation thermometer. However, under different measuring conditions, the emissivity of the material is a variable quantity, influenced by many factors such as temperature, wavelength and roughness, which seriously restricts the rapid development of the radiation temperature measurement. In contrast to non-polarized emissivity. The polarization spectral emissivity of the material has some special properties, and its application in the fields of radiation temperature measurement and remote sensing can be explored by studying the variation of the polarization spectral emissivity of the material. In recent years, the research on the properties of the material's polarized radiation has been strengthened at home and abroad. However, it has to be admitted that the measurement equipment related to the polarization emissivity is still very small, and the corresponding polarized emissivity data is also very scarce. Based on the support of the National Natural Science Foundation of China, a set of experimental apparatus for measuring the emissivity of the polarization spectrum is set up, and the radiation properties of pure aluminum and titanium alloy are studied. The main work of this paper is as follows:1. An experimental device for measuring the emissivity of a set of polarization spectrum is established based on the energy method. The device includes a sample heating and temperature control system, a blackbody, an optical system, a mechanical system, an electric system and a signal acquisition system. wherein the sample heating system and the blackbody furnace belong to a radiation signal source in the device; the optical system mainly comprises a filter plate, a polarization beam splitting cube, a radiation probe, an optical fiber and an optical switch, wherein the mechanical system is mainly used for controlling the conversion of the sample and the black body and realizing the radiation measurement at different angles; the electric system consists of the following two parts:1, a detector;2, an amplification system consisting of a chopper and a phase-locked amplifier; the signal acquisition system controls the rotation of the motor based on the Labview software, and acquires and stores the output signal of the phase-locked amplifier; and 2, Including the uniformity of the temperature of the sample, the uniformity of the axial temperature of the blackbody furnace and the response coefficient of the system. the reliability of the device is verified by comparing the measured spectral emissivity data of the silicon wafer with the theoretical simulation and the foreign experimental data, and 3, a method for simulating the direction emissivity of the rough metal surface is provided, Through the comparison of the theoretical calculation and the experimental data, the method can be used to estimate the direction emissivity of 0-70 掳 in the rough metal oxidation process, and it is concluded that with the increase of the oxidation degree, The emissivity of the rough pure aluminum surface in the direction of 0-70 DEG is gradually increased, and the emissivity of 70 DEG is almost unchanged. The surface temperature of the rough pure aluminum, the experimental results and the comparison of the measurement results of the thermocouple are proved by using the directional emissivity of the simulation. The method can be used for the radiation temperature measurement. And the emissivity of the Ti-6Al-4V alloy in the thermal oxidation process and the specific cause of the change of the emissivity in the oxidation process are studied. The results show that the spectral emissivity of the pre-oxidized Ti-6Al-4V alloy increases linearly with the temperature in the range of 823-973K; when the oxidation temperature is lower than 873 K, the emissivity increases with the oxidation time, and when the temperature is higher than 923 K, the emissivity changes with the time; The surface roughness is one of the factors that affect the change of the amplitude of the emissivity fluctuation curve. The interference between the oxide film and the substrate is the main cause of the change of the emissivity. When the Ti-6Al-4V alloy is thermally oxidized in the air, the surface oxide film follows the law of the parabola growth. And the oxidation rate will increase rapidly when the temperature is greater than 923 k.
【学位授予单位】：河南师范大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：O433.1
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