物理不可克隆函数电路研究

发布时间：2018-05-07 03:32

本文选题：物理不可克隆函数 + 工艺偏差　；参考：《宁波大学》2014年硕士论文

【摘要】：物理不可克隆函数（Physical Unclonable Functions，PUF）电路作为一种新型的密钥生成电路，利用集成电路（Integrated Circuit，IC）制造过程中的工艺参数偏差，在相同的电路结构下产生多个不同的密钥数据，实现具有芯片身份标识的硬件函数功能。PUF电路可用于数据加密、数字签名、消息认证以及硬件知识产权保护等多种信息系统，提高系统安全性。鉴此，本文以PUF电路为研究对象，在综合分析PUF电路研究意义和当前国内外研究现状情况下，提出多种新型的PUF电路设计方案，包括基于电流镜的PUF电路设计、基于最优控制电压的PUF电路设计、基于SRAM的PUF电路设计和基于DAC的PUF电路设计。最后，采用Cadence等软件，分析PUF电路在不同条件下的工作性能。论文的研究内容主要包含以下几个部分： 1、基于电流镜的PUF电路设计：通过对电流镜工作特性的研究，结合PUF电路的工作原理，将多路电流镜作为PUF电路的偏差信号产生电路，用于产生随机的电流信号，然后通过分析电流型敏感放大器的工作特性，将其作为PUF电路的输出电路，用于比较偏差电流信号的大小，并产生输出响应信号，进而实现PUF电路的功能。 2、基于最优控制电压的PUF电路设计：首先分析影响PUF电路可靠性的因素，确定提高PUF电路可靠性的方法，然后通过对MOSFET零温度系数点（ZeroTemperatureCoefficient，ZTC）理论的研究，分析在工艺偏差情况下MOSFET的零温度系数点变化情况，并与提高PUF电路可靠性方法相结合，提出基于最优控制电压的PUF电路设计方案，最终实现输出响应信号可靠的目的。 3、基于SRAM的PUF电路设计：首先对传统SRAM-PUF电路的结构和工作原理进行研究，分析电路在读操作过程中的稳定性问题，然后结合SRAM单元电路和寄存器堆电路设计过程中提高读稳定性方法，提出一种新型的SRAM-PUF单元电路设计方案，通过对传统的SRAM-PUF单元电路插入隔离管的方式，实现读静态噪声容限有效提升的目的，最终提高电路的稳定性。 4、基于DAC的PUF电路设计：通过对数模转换器（Digital-to-Analog Converter，DAC）电路的研究，分析其输出模拟信号的特点，结合PUF电路的设计方法，将两组DAC作为PUF电路的偏差信号产生电路，然后结合提高PUF电路可靠性的方法，确定DAC的拓扑结构类型，，并分析其输出电压信号的偏差模型，最后借助灵敏放大器产生PUF电路的输出响应。对于提出的几种PUF电路设计方案均在TSMC65nm CMOS工艺或SMIC65nm CMOS工艺下进行全定制版图设计，并利用Spectre等工具对电路进行Monte Carlo仿真。结果表明在不同的工作电压或温度下，电路均表现出较好的的随机性和可靠性。
[Abstract]:The Physical Unclonable Functions (PUF) circuit is a new type of key generation circuit, using the process parameter deviation in the manufacturing process of Integrated Circuit (IC), producing a number of different key data under the same circuit structure, and realizing the function.PUF of the hardware function with the identity of the chip. The circuit can be used for data encryption, digital signature, message authentication and hardware intellectual property protection to improve the security of the system. In this paper, the PUF circuit is used as the research object. In the comprehensive analysis of the significance of PUF circuit research and the current situation at home and abroad, a variety of new PUF circuit design schemes are proposed, including based on the design of the circuit. PUF circuit design of current mirror, design of PUF circuit based on optimal control voltage, PUF circuit design based on SRAM and PUF circuit design based on DAC. Finally, using Cadence and other software, the performance of PUF circuit under different conditions is analyzed. The main contents of this paper include the following parts:
1, the PUF circuit design based on the current mirror: through the study of the working characteristics of the current mirror and the working principle of the PUF circuit, the multi current mirror is used as the deviation signal of the PUF circuit to produce the circuit, which is used to generate the random current signal. Then, by analyzing the working characteristics of the current sensitive amplifier, it is used as the output circuit of the PUF circuit, It is used to compare the magnitude of the bias current signal and generate the output response signal, so as to realize the function of the PUF circuit.
2, PUF circuit design based on the optimal control voltage: first, analyze the factors that affect the reliability of the PUF circuit, and determine the method to improve the reliability of the PUF circuit. Then through the study of the MOSFET zero temperature coefficient point (ZeroTemperatureCoefficient, ZTC) theory, the change of the zero temperature coefficient point of the MOSFET under the condition of the process deviation is analyzed, and the extraction of the zero temperature coefficient point of the MOSFET is analyzed. Combining the reliability method of high PUF circuit, a PUF circuit design scheme based on optimal control voltage is put forward, and finally the output response signal is reliable.
3, the design of PUF circuit based on SRAM: first, the structure and working principle of the traditional SRAM-PUF circuit are studied. The stability of the circuit is analyzed in the reading operation process. Then a new SRAM-PUF unit circuit design scheme is proposed, which combines the SRAM unit circuit and the register heap circuit design process to improve the reading stability. After the traditional SRAM-PUF unit is inserted into the isolating tube, the purpose of reading the static noise margin can be effectively enhanced, and finally the stability of the circuit is improved.
4, PUF circuit design based on DAC: through the study of the Digital-to-Analog Converter (DAC) circuit, the characteristics of its output analog signal are analyzed. Combined with the design method of PUF circuit, two groups of DAC are generated as the deviation signal of PUF circuit, and then the method of improving the reliability of the PUF circuit and determining the topology of DAC is determined. The deviation model of the output voltage signal is analyzed, and finally the output response of the PUF circuit is generated by means of a sensitive amplifier.
Some of the proposed PUF circuits are designed in the TSMC65nm CMOS process or SMIC65nm CMOS process, and the circuits are simulated with Monte Carlo using Spectre and other tools. The results show that the circuit shows good randomness and reliability at different working voltages or temperatures.

【学位授予单位】：宁波大学
【学位级别】：硕士
【学位授予年份】：2014
【分类号】：TN405

【参考文献】