Plasma-assisted surface treatment for low-temperature anneal
发布时间:2024-05-07 02:32
In this study, a low-temperature annealed ohmic contact process was proposed on Al Ga N/Ga N heterostructure field effect transistors(HFETs) with the assistance of inductively coupled plasma(ICP) surface treatment. The effect of ICP treatment process on the 2DEG channel as well as the formation mechanism of the low annealing temperature ohmic contact was investigated. An appropriate residual Al Ga N thickness and a plasma-induced damage are considered to contribute to the low-temperature anneale...
【文章页数】:4 页
本文编号:3966692
【文章页数】:4 页
本文编号:3966692
本文链接:https://www.wllwen.com/kejilunwen/dianzigongchenglunwen/3966692.html
教材专著