基于电源电流的芯片故障诊断与预测研究

发布时间：2018-04-25 11:16

本文选题：故障诊断与预测 + 电源电流　；参考：《华南理工大学》2016年硕士论文

【摘要】：随着现代信息技术的迅速发展,航空电子系统的复杂性、综合性和智能性程度不断提高,其研制、生产尤其是维护和保障的成本也越来越高。对于构成航电系统各个模块的芯片,其可靠性将直接影响整个系统的可靠性和安全性。对相关芯片进行故障诊断与预测,将有利于提高设备乃至整个系统的可靠性,同时降低航电系统的维护成本。对于芯片的检测,传统的基于电压的故障诊断方法在故障类型和故障覆盖率方面存在缺点。实际上IC芯片是由很多晶体管组成的CMOS集成电路,而晶体管的退化会导致芯片电源电流的变化,因此我们采用基于旁路信号——电源电流的芯片故障检测方法。电源电流包括静态电流(IDDQ)和动态电流(IDDT),对于芯片故障的诊断与预测,可以转换成对相关电源电流的检测与分析。本文主要以芯片MP2380和HS7408为本次研究的实验对象,基于电源电流技术,将其分成两个方面进行研究:(1)电磁干扰条件下的故障诊断与预测,(2)与性能退化相关的故障诊断与预测。首先,将芯片MP2380单独置于事先建立好的电磁环境中,用来模拟芯片在实际运行过程中所受到的电磁干扰,对采集到的数据进行FFT频谱分析,通过幅频特性曲线、相频特性曲线和功率谱的对比,诊断芯片是否受到较大的外界干扰。然后,对正常芯片HS7408施加过电压使其性能退化,用来模拟芯片出现故障后的性能退化,对正常芯片和性能退化芯片的相关数据进行多种方法的处理,包括建立IDDT-IDDQ关系图和FFT频谱分析等方法,尤其是通过相频特性曲线的变化规律来实现预警作用,最终完成对芯片的故障诊断与预测。
[Abstract]:With the rapid development of modern information technology, the complexity of the avionics system, the degree of comprehensiveness and intelligence are increasing, and the cost of production, especially maintenance and guarantee is becoming higher and higher. The reliability and safety of the whole system will directly affect the reliability and safety of the whole system for the modules of the avionics system. The fault diagnosis and prediction of the chip will help to improve the reliability of the equipment and even the whole system, and reduce the maintenance cost of the avionics system. For the detection of the chip, the traditional voltage based fault diagnosis method has shortcomings in the fault type and fault coverage. In fact, the IC chip is a CMOS integration composed of many transistors. The degradation of the transistors will lead to changes in the power current of the chip. Therefore, we adopt the method of chip fault detection based on the bypass signal power current. The power current includes the static current (IDDQ) and the dynamic current (IDDT). The diagnosis and prediction of the chip fault can be converted to the detection and analysis of the related power current. This paper mainly uses chip MP2380 and HS7408 as the experimental object of this study. Based on the power current technology, it is divided into two aspects: (1) fault diagnosis and prediction under electromagnetic interference, (2) fault diagnosis and prediction related to performance degradation. First, the chip MP2380 is placed in a pre established electromagnetic environment alone. To simulate the electromagnetic interference that the chip is subjected to in the actual operation, the FFT spectrum analysis of the collected data is carried out. Through the amplitude frequency characteristic curve, the phase frequency characteristic curve and the power spectrum, the diagnosis chip is subjected to large external interference. Then, the performance of the normal chip HS7408 is applied to the performance degradation of the chip, which is used to simulate the chip. The performance degradation after the failure occurs, and the related data of the normal chip and the performance degradation chip are processed in many ways, including the establishment of the IDDT-IDDQ diagram and the FFT spectrum analysis, especially through the change of the phase frequency characteristic curve to realize the early warning function, and finally the fault diagnosis and prediction of the chip are finished.

【学位授予单位】：华南理工大学
【学位级别】：硕士
【学位授予年份】：2016
【分类号】：V267

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