共轴共聚焦干涉式表面等离子体显微成像技术

发布时间：2018-02-12 18:25

本文关键词： 显微成像共聚焦干涉表面等离子体成像系统纳米检测　出处：《北京航空航天大学学报》2017年07期 　论文类型：期刊论文

【摘要】：表面等离子体(SPs)显微成像技术能够在纳米尺度上对材料折射率的局部变化以及材料的表面形貌进行检测,这一特性使其在生物医疗及半导体材料等领域有很多的应用。提出一种新型共轴共聚焦干涉式表面等离子体显微成像技术,该技术可以定量地对折射率变化进行检测,而且具有实现简单、成本低、对环境条件要求低、信噪比高等优点。采用压电陶瓷微纳米移动平台在显微物镜的焦面附近对样品进行扫描,SPs信号与参考光的相对相位会改变从而产生一个周期性的振荡信号即V(z)曲线。同时该技术能够通过控制样品的离焦距离来实现图像对比度的可控,而且这一举措不会显著地降低图像的分辨率及对比度。也分别从理论仿真和实验结果上证明了该技术的可行性。
[Abstract]:Surface plasma SPS (Surface Plasma Spectroscopy) microimaging technique can be used to detect the local change of refractive index and the surface morphology of materials at nanometer scale. It has many applications in biomedicine and semiconductor materials. A new coaxial confocal interferometric surface plasma microimaging technique is proposed, which can quantitatively detect refractive index change. And has the realization simple, the cost is low, the request to the environment condition is low, Using piezoelectric ceramic micro / nano moving platform to scan the sample near the focal plane of the objective lens and the relative phase of the reference light will change, which will produce a periodic oscillation signal, that is, the Vapor zag curve, which has the advantages of high signal-to-noise ratio (SNR). At the same time, the technology can control the contrast of the image by controlling the defocus distance of the sample. Moreover, this method does not significantly reduce the resolution and contrast of the image, and the feasibility of the technique is proved by theoretical simulation and experimental results.
【作者单位】：北京航空航天大学自动化科学与电气工程学院;中国人民大学理学院;
【基金】：国家自然科学基金(61405006,11304381) 虚拟现实技术与系统国家重点实验室开放基金(BUAA-VR-15KF-04) 中央高校基本科研业务费专项资金(YWF-14-ZDHXY-09) 北京航空航天大学优青培育基金(YWF-15-6)~~
【分类号】：O53;TP391.41

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