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溶胶-凝胶法制备五氧化二钒薄膜材料及其性能研究

发布时间:2018-03-12 23:29

  本文选题:V_2O_5薄膜 切入点:无机溶胶-凝胶法 出处:《昆明理工大学》2011年硕士论文 论文类型:学位论文


【摘要】:本论文首先对作为功能材料的V2O5薄膜的研究现状进行了概述。围绕V2O5薄膜的无机溶胶-凝胶制备工艺、通过SEM、XRD、U-V光谱分析和CV等检测手段对其组织结构和性能进行了一系列的研究,具体结论如下: 采用改进的无机溶胶-凝胶法,研究了实验条件对制备V2O5溶胶和V2O5薄膜结构和性能的影响。实验结果表明,采用电磁结合超声波的搅拌方式能够达到促进晶粒细化,制备性能良好的V2O5溶胶体系。热处理后的XRD分析表明:在不同衬底上获得具有不同取向生长的V2O5薄膜,采用提拉法时,ITO导电玻璃衬底上的V2O5薄膜具有β-V2O5结构,载玻片衬底上的V2O5薄膜具有γ-V2O5结构,研究发现由于在不同衬底上附着力和内应力不同,经过热处理的作用,V-O键的动力学和热力学稳定性发生改变,促使这个薄膜结构发生转变。采用电泳沉积法时,电压为15V时,薄膜结构为属于α-V205结构,而沉积电压为20V和25V时,薄膜具有α-V2O5和β-V2O5共存的结构。 U-V光谱分析表明:由于制备方法和薄膜结构不同,在350nm~420nm的短波区,α-V2O5结构的薄膜吸收率最高,β-V2O5结构的次之,γ-V2O5结构的最低,在550nm以上的可见光区,γ-V2O5结构的薄膜透射率最高,达到77%左右,α-V2O5结构的最低,只有56%左右,不同结构的V2O5薄膜透射率变化基本相似。 CV测试表明:不同制备方法制备的V2O5薄膜均出现了形状极不对称还原氧化峰,说明锂离子在V2O5薄膜材料中的嵌入和脱出是一个多相的反应过程,生成了不同相的钒青铜,锂离子可以在V2O5薄膜中进行可逆的嵌入/脱嵌。 报道了V2O5纳米线的制备过程并对其光学性能进行了研究。本实验通过对ITO导电玻璃上V2O5薄膜热处理机制的控制,500℃热处理后制备了β结构的V2O5纳米线,无需高温高压的条件,且设备及工艺过程简单,对研究V2O5纳米线的制备具有一定的参考价值。U-V光谱分析表明:400℃和500℃热处理的V2O5纳米线具有大致相同的透射率,但随着热处理温度的升高,V2O5薄膜透射率降低。
[Abstract]:In this paper, the research status of V _ 2O _ 5 thin films as functional materials is summarized. The preparation process of inorganic sol-gel for V _ 2O _ 5 thin films is introduced. A series of studies were carried out on its structure and properties by means of SEMN XRDU U-V spectrum analysis and CV. The specific conclusions are as follows:. The effects of experimental conditions on the structure and properties of V _ 2O _ 5 sol and V _ 2O _ 5 thin films were studied by an improved inorganic sol-gel method. After heat treatment, V _ 2O _ 5 thin films with different orientation were obtained on different substrates, and V _ 2O _ 5 films on conductive glass substrates with 尾 -V _ 2O _ 5 structure were obtained by Czochralski method. The V _ 2O _ 5 thin films on glass substrates have 纬 -V _ 2O _ 5 structure. It is found that due to the different adhesion and internal stress on different substrates, the dynamic and thermodynamic stability of V-O bond after heat treatment is changed. By electrophoretic deposition method, the structure of the film is 伪 -V205 when the voltage is 15V, and the structure is 伪 -V _ 2O _ 5 and 尾 -V _ 2O _ 5 when the deposition voltage is 20V and 25V, and the structure of the film is 伪 -V _ 2O _ 5 and 尾 -V _ 2O _ 5 when the electrophoretic deposition method is used. U-V spectroscopic analysis shows that the absorption rate of 伪 -V _ 2O _ 5 structure is the highest, 尾 -V _ 2O _ 5 structure is the second, 纬 -V _ 2O _ 5 structure is the lowest, and the transmittance of 纬 -V _ 2O _ 5 structure is the highest in the visible region above 550 nm due to the difference of preparation method and the structure of the thin film, in the region of 350nm 420nm, 伪 -V _ 2O _ 5 structure has the highest absorption rate, and 尾 -V _ 2O _ 5 structure has the lowest structure. About 77%, the 伪 -V _ 2O _ 5 structure is the lowest, only about 56%. The transmittance changes of different structure V _ 2O _ 5 thin films are similar. CV test showed that the V _ 2O _ 5 thin films prepared by different preparation methods had a very asymmetric reduction and oxidation peak, which indicated that the intercalation and removal of lithium ions in V _ 2O _ 5 thin films was a multiphase reaction process, and vanadium bronze with different phases was formed. Lithium ions can be reversibly embedded / deintercalated in V _ 2O _ 5 thin films. The preparation process and optical properties of V _ 2O _ 5 nanowires are reported in this paper. The 尾 -structure V _ 2O _ 5 nanowires were prepared by controlling the heat treatment mechanism of V _ 2O _ 5 thin films on ITO conductive glass after heat treatment at 500 鈩,

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